Performs cross-correlation calculations on an input NDF image file. The resulting image/plot is stored in an output NDF.
For each image pixel in turn, all the pixels within a defined radius are identified. The values for each of these in turn have their background values subtracted and the result (F1) multiplied by a factor (F2) generated using an exponential function. The values obtained for all the surrounding image pixels are summed. The total generated is divided by using a normalisation value created by taking the sums of square for F1 and F2, multiplying them together and then taking the square root. This normalised sum is placed in the appropriate pixel of the output image and the program moves on to the next input image pixel to be considered.
The circular elliptical mask used is of a radius 1.8x the scale length requested. Studies undertaken by Phillipps and Davies at Cardiff suggest that this value optimises the detection sensitivity.
The correlation value obtained is multiplied by 1000 (or a user defined value) to make display easier.
A border is present in the final output image which is the same width as the radius of the template used. Pixels within the border have been assigned the value bad.
Correlates image HH1826 with a mask/template optimised for galaxies of 8 arc seconds scale length. The pixel size on the image is .3 arc second, the background count value 7437 and all the pixels on the image can be used in the calculation. The output image is to be named CORREL.
Correlates image FORN with a mask/template optimised for galaxies of 4 arc seconds scale length. The pixel size is .22 arc seconds and the background count value 666.
Pixels that are brighter than 66615x3 counts are not included in the correlation calculations (USEALL=FALSE). The output image is to be named FORN4.
To establish the statistical significance of a detection, this application should be used in conjunction with MIXUP to allow noise equivalent images to be generated and correlated thereby establishing a 3 sigma limit.
ESP --- Extended Surface Photometry